Online Workshop Nanoparticle Data Processing Rietveld Refinement

Two-Week Online Workshop on

Material Characterization & Data Processing

Microscopy | Spectroscopy | X-ray Techniques Techniques 

Date

02 -16 September 2024

Time

07.30 pm IST

About the Workshop

Intensive two-week online workshop on ‘Material Characterization Techniques‘, designed to provide comprehensive knowledge and practical skills in analyzing various materials. This workshop covers a wide range of characterization methods essential for researchers, scientists, and professionals working in materials science and engineering. Through a series of expert-led sessions, participants will gain hands-on experience in data analysis and interpretation of various charectorization techniques such as, Microscopy Techniques, Spectroscopic Techniques, Surface Area Analysis and X-ray Techniques  ensuring they can effectively utilize these techniques in their respective fields.

Microscopy Techniques

  • Transmission Electron Microscopy (TEM) Data Analysis
  • Scanning Electron Microscopy (SEM & EDS)  Data Analysis
  • Atomic Force Microscopy (AFM) Data Analysis

Spectroscopy Techniques

  • UV-Vis Spectrum analysis
  • FT-IR spectrum analysis
  • Raman spectrum analysis

X-ray Techniques

  • X-ray Diffraction (XRD) data refinement 
  • X-ray Photoelectron Spectroscopy (XPS) data analysis 
  • MATCH! Software – Advanced options & Phase identification

Target Audience

Students, Researchers and faculty members of Chemistry, Physics, Material Science and Engineering, who are interested in learning about material charectorization techniques.

Recordings & Certificate

  • All live sessions will be recorded and made available for future reference.
  • Participants will receive an e-certificate of completion. 

Course Plan

Please download the course plan and  Brochure from the links provided below.

Download Now 

Brochure 

Program Schedule

Two-Weeek Online Workshop on Material Characterization & Data Analysis

Day & Time

Session

Resource Person

Link

Characterization I: Microscopy Techniques​

Characterization II: Spectroscopy Techniques

Characterization III: Particle Size and Surface Area Analysis

Characterization IV: X-ray Techniques

Resource Persons

Research Associate, Brookhaven National Laboratory, USA

Assistant Professor, Department of Physics, Graphic Era Hill University, Dehradun, Uttarakhand, India

Assistant Professor, Yeungnam University, South Korea

Assistant Professor, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai

CSIR Research Associate, NIT, Srinagar

CSIR Research Associate, IIT Hyderabad

Research Associate, Christ College, Thrissur

Assistant Professor, Department of Chemical Engineering, Yeungnam University, South Korea

Registration

Registration Fee

Rs. 3000

Registration Fee

For Indian Participants: Rs. 3000
Foriegn Participants: USD. 50

SIAS Research Forum Members
Student Member: Rs. 2700
Faculty Member: Rs. 2400

Feedback from the participants

We will update this part after the compltion of the workshop!