Online Workshop Nanoparticle Data Processing Rietveld Refinement
Two-Week Online Workshop on
Material Characterization & Data Processing
Microscopy | Spectroscopy | X-ray Techniques Techniques

Date
02 -16 September 2024

Time
07.30 pm IST
About the Workshop
Intensive two-week online workshop on ‘Material Characterization Techniques‘, designed to provide comprehensive knowledge and practical skills in analyzing various materials. This workshop covers a wide range of characterization methods essential for researchers, scientists, and professionals working in materials science and engineering. Through a series of expert-led sessions, participants will gain hands-on experience in data analysis and interpretation of various charectorization techniques such as, Microscopy Techniques, Spectroscopic Techniques, Surface Area Analysis and X-ray Techniques ensuring they can effectively utilize these techniques in their respective fields.
Microscopy Techniques
- Transmission Electron Microscopy (TEM) Data Analysis
- Scanning Electron Microscopy (SEM & EDS) Data Analysis
- Atomic Force Microscopy (AFM) Data Analysis
Spectroscopy Techniques
- UV-Vis Spectrum analysis
- FT-IR spectrum analysis
- Raman spectrum analysis
X-ray Techniques
- X-ray Diffraction (XRD) data refinement
- X-ray Photoelectron Spectroscopy (XPS) data analysis
- MATCH! Software – Advanced options & Phase identification
Target Audience
Students, Researchers and faculty members of Chemistry, Physics, Material Science and Engineering, who are interested in learning about material charectorization techniques.
Recordings & Certificate
- All live sessions will be recorded and made available for future reference.
- Participants will receive an e-certificate of completion.
Course Plan
Program Schedule
Two-Weeek Online Workshop on Material Characterization & Data Analysis
Day & Time
Session
Resource Person
Link
Characterization I: Microscopy Techniques
- Day 1, 07.30 pm
- Transmission Electron Microscopy (TEM) Data Analysis
- Dr. Shivani Sharma
- Day 2, 07.30 pm
- Scanning Electron Microscopy (SEM & EDS) Data Analysis
- Dr. Sumit Pokhriyal
- Day 3, 06.00 pm
- Atomic Force Microscopy (AFM) Data Analysis
- Dr. S. Divya
Characterization II: Spectroscopy Techniques
- Day 4, 07.30 pm
- UV-Vis Spectroscopy
- Dr. Pradeep Reddy Vanga
- Day 5, 06.00 pm
- Fourier Transform Infrared Spectroscopy (FTIR)
- Raman Spectroscopy
- Dr. S. Divya
Characterization III: Particle Size and Surface Area Analysis
- Day 6, 07.30 pm
- Brunauer-Emmett-Teller (BET) surface area analysis - Part 1
- Dr. Julia Garvasis
- Day 7, 06.00 pm
- Brunauer-Emmett-Teller (BET) surface area analysis - Part 2
- Dr. Ramya Ramkumar
- Day 8, 07.30 pm
- Zeta potential measurement
- Dr. Anupama R Prasad
Characterization IV: X-ray Techniques
- Day 9, 07.30 pm
- X-ray Diffraction (XRD)
- Dr. Pradeep Reddy Vanga
- Day 10, 07.30 pm
- X-ray Photoelectron Spectroscopy (XPS) Part 1
- Dr. Sofi Suhail Majid
- Day 11, 07.30 pm
- X-ray Photoelectron Spectroscopy (XPS) Part 2
- Dr. R. Dhanabal
- Day 12, 07.30 pm
- MATCH! Software - Advanced options & Phase identification
- Dr. Pradeep Reddy Vanga
Resource Persons

Assistant Professor, Department of Physics, Graphic Era Hill University, Dehradun, Uttarakhand, India

Assistant Professor, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai

Assistant Professor, Department of Chemical Engineering, Yeungnam University, South Korea
Registration
Registration Fee
For Indian Participants: Rs. 3000
Foriegn Participants: USD. 50
SIAS Research Forum Members
Student Member: Rs. 2700
Faculty Member: Rs. 2400
Feedback from the participants
We will update this part after the compltion of the workshop!