Training Program on
Date
26 - 30 August 2025
Time
07.30 pm IST
About the Workshop
The 5-Day Online Workshop on XPS Data Analysis offers a comprehensive introduction and hands-on experience in X-ray Photoelectron Spectroscopy (XPS) data analysis, one of the most powerful surface characterization techniques in materials science.
This workshop is designed for researchers, students, and professionals looking to strengthen their understanding of XPS principles, instrumentation, and data interpretation.
Participants will gain insights into the physics behind photoemission, the working components of an XPS instrument, and methods for elemental and chemical state analysis. Each session is carefully structured to combine theoretical background with practical approaches, including live demonstrations of real data analysis. A dedicated session is reserved for participants to analyze their own datasets or provided examples under expert guidance.
Target Audience
Students, Researchers and faculty members of chemistry, physics and material science
Key Topics:
- XPS Spectra Analysis: Elemental Identification & Quantification
- Applications of XPS in Modern Research: Live Data analysis using XPS in nanomaterials, catalysts, semiconductors, and thin films
Features
- Real-time XPS data analysis using case studies from nanomaterials, catalysts, semiconductors, and thin films.
- Dedicated session for participants to analyze their own data or sample datasets with guided support.
Recording for Future Referenece
All live sessions will be recorded and made available to participants for future reference and continued learning.
Course Completion Certificate
At the end of the workshop, participants will receive an e-certificate of completion.
Course Plan
Please download the course plan and Brochure from the links provided below.
Schedule
One-Weeek Workshop on XPS Data Analysis
Day & Time
Session
Topics
Link
- Day 1, 07.30 pm
- Introduction: Background Theory
- Photoelectric effect (Einstein’s concept)
- Principle of XPS and instrumentation overview
- Types of electrons detected (core-level, Auger)
- Day 2, 07.30 pm
- "Inside an XPS Instrument: Components, Working & Calibration" X-ray sources: Al Kα and Mg Kα
- Electron energy analyzers (hemispherical analyzer)
- Vacuum system, detectors, and data acquisition
- Energy resolution and instrument calibration
- Types of samples suitable for XPS
- Day 3, 07.30 pm
- XPS Spectra Analysis
- Understanding peak positions, intensities, and widths
- Peak fitting and deconvolution techniques
- Chemical shift and oxidation state information
- Quantitative analysis: atomic concentration calculations
- Survey scans vs. high-resolution scans
- Day 4, 07.30 pm
- Applications of XPS in Modern Research
- Live Data analysis using XPS in nanomaterials, catalysts, semiconductors, and thin films
- Day 5, 07.30 pm
- Doubt-Clearing Session
- Participants data analysis using XPS in nanomaterials, catalysts, semiconductors, and thin films
Resource Person
Deptment of Physics, National Institute of Technology Pondicherry
Registration
For Indian Participants: Rs. 2000
Foriegn Participants: USD. 45
SIAS Research Forum Members
Student Member: Rs. 1800
Faculty Member: Rs. 1600
Feedback from the participants
We will update this part after the compltion of the workshop!